半导体环氧树脂检测标准，半导体环氧树脂检测标准标准内容,检测中心-北检（北京）检测技术研究院

MIL MIL-PRF-19500/717 Notice 3-Validation 3

SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, BIDIRECTIONAL TRANSIENT VOLTAGE SUPPRESSOR, TYPES 1N6036AUEG THROUGH 1N6072AUEG, 1N6036AUEJ THROUGH 1N6072AUEJ, JAN, JANTX, AND JANTXV
SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, BIDIRECTIONAL TRANSIENT VOLTAGE SUPPRESSOR, TYPES 1N6036AUEG THROUGH 1N6072AUEG, 1N6036AUEJ THROUGH 1N6072AUEJ, JAN, JANTX, AND JANTXV

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2020-02-26
【CCS分类】分离机械
【ICS分类】实验室器皿和有关仪器

MIL MIL-PRF-19500/717

SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, BIDIRECTIONAL TRANSIENT VOLTAGE SUPPRESSOR, TYPES 1N6036AUEG THROUGH 1N6072AUEG, 1N6036AUEJ THROUGH 1N6072AUEJ, JAN, JANTX, AND JANTXV
SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, BIDIRECTIONAL TRANSIENT VOLTAGE SUPPRESSOR, TYPES 1N6036AUEG THROUGH 1N6072AUEG, 1N6036AUEJ THROUGH 1N6072AUEJ, JAN, JANTX, AND JANTXV

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2005-05-09
【CCS分类】分离机械
【ICS分类】地质学、气象学、水文学

MIL MIL-PRF-19500/716 Notice 3-Validation 3

SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, UNIPOLAR TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N5555UEG THROUGH 1N5558UEG, 1N5555UEJ THROUGH 1N5558UEJ, 1N5629AUEG THROUGH 1N5665AUEG, 1N5629AUEJ THROUGH 1N5665AUEJ, 1N5907UEG, 1N5907
SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, UNIPOLAR TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N5555UEG THROUGH 1N5558UEG, 1N5555UEJ THROUGH 1N5558UEJ, 1N5629AUEG THROUGH 1N5665AUEG, 1N5629AUEJ THROUGH 1N5665AUEJ, 1N5907UEG, 1N5907

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2020-02-26
【CCS分类】分离机械
【ICS分类】地质学、气象学、水文学

MIL MIL-PRF-19500/716 Notice 2-Validation 2

Semiconductor Device, Diode, Non-Hermetic, Epoxy, Surface Mount, Silicon, Unipolar Transient Voltage Suppressor Types 1N5555UEG through 1N5558UEG, 1N5555UEJ through 1N5558UEJ, 1N5629AUEG through 1N5665AUEG, 1N5629AUEJ through 1N5665AUEJ, 1N5907UEG, 1N5907UEJ JAN, JANTX, and JANTXV
Semiconductor Device, Diode, Non-Hermetic, Epoxy, Surface Mount, Silicon, Unipolar Transient Voltage Suppressor Types 1N5555UEG through 1N5558UEG, 1N5555UEJ through 1N5558UEJ, 1N5629AUEG through 1N5665AUEG, 1N5629AUEJ through 1N5665AUEJ, 1N5907UEG, 1N5907UEJ JAN, JANTX, and JANTXV

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2015-03-18
【CCS分类】
【ICS分类】地质学、气象学、水文学

MIL MIL-PRF-19500/716

SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, UNIPOLAR TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N5555UEG THROUGH 1N5558UEG, 1N5555UEJ THROUGH 1N5558UEJ, 1N5629AUEG THROUGH 1N5665AUEG, 1N5629AUEJ THROUGH 1N5665AUEJ, 1N5907UEG, 1N5907
SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, UNIPOLAR TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N5555UEG THROUGH 1N5558UEG, 1N5555UEJ THROUGH 1N5558UEJ, 1N5629AUEG THROUGH 1N5665AUEG, 1N5629AUEJ THROUGH 1N5665AUEJ, 1N5907UEG, 1N5907

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2005-04-28
【CCS分类】
【ICS分类】云母基材料

T/CNIA 0143-2022

半导体材料痕量杂质分析用超纯树脂器皿

【发布单位或类别】 CN-TUANTI团体标准
【发布日期】2022-02-28
【CCS分类】
【ICS分类】71.040.20

T/ZGM 007-2024

半导体行业超纯水工艺抛光混床用离子交换树脂产品认证技术要求

【发布单位或类别】 CN-TUANTI团体标准
【发布日期】2024-05-24
【CCS分类】J77
【ICS分类】07.060

T/ZGM 006-2024

半导体行业超纯水工艺制程混床用离子交换树脂产品认证技术要求

【发布单位或类别】 CN-TUANTI团体标准
【发布日期】2024-05-24
【CCS分类】J77
【ICS分类】07.060

T/ZGM 005-2024

半导体行业超纯水工艺预处理阴阳塔用离子交换树脂产品认证技术要求

【发布单位或类别】 CN-TUANTI团体标准
【发布日期】2024-05-24
【CCS分类】J77
【ICS分类】07.060

UNE-EN 60371-3-7:1996

SPECIFICATION FOR INSULATING MATERIALS BASED ON MICA. PART 3: SPECIFICATIONS FOR INDIVIDUAL MATERIALS. SHEET 7: POLYESTER FILM MICA PAPER WITH AN EPOXY RESIN BINDER FOR SINGLE CONDUCTOR TAPING.
SPECIFICATION FOR INSULATING MATERIALS BASED ON MICA. PART 3: SPECIFICATIONS FOR INDIVIDUAL MATERIALS. SHEET 7: POLYESTER FILM MICA PAPER WITH AN EPOXY RESIN BINDER FOR SINGLE CONDUCTOR TAPING.

【发布单位或类别】 ES-UNE西班牙标准
【发布日期】1996-11-12
【CCS分类】
【ICS分类】

IEC 60371-3-7:1995/AMD1:2006

Amendment 1 - Insulating materials based on mica - Part 3: Specifications for individual materials - Sheet 7: Polyester film mica paper with an epoxy resin binder for single conductor taping
Amendment 1 - Insulating materials based on mica - Part 3: Specifications for individual materials - Sheet 7: Polyester film mica paper with an epoxy resin binder for single conductor taping

【发布单位或类别】 IX-IEC国际电工委员会
【发布日期】2006-09-27
【CCS分类】
【ICS分类】29.035.50

MIL MIL-PRF-19500/623A Notice 1-Validation

SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, PNP, SILICONE, HIGH-POWER TYPE 2N7371 JANTX JANTXV, AND JANS (SUPERSEDING MIL-S-19500/623) (S/S BY MIL-PRF-19500/623B)
SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, PNP, SILICONE, HIGH-POWER TYPE 2N7371 JANTX JANTXV, AND JANS (SUPERSEDING MIL-S-19500/623) (S/S BY MIL-PRF-19500/623B)

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2002-11-08
【CCS分类】
【ICS分类】

MIL MIL-PRF-19500/623A

SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, PNP, SILICONE, HIGH-POWER TYPE 2N7371 JANTX JANTXV, AND JANS (SUPERSEDING MIL-S-19500/623) (S/S BY MIL-PRF-19500/623B)
SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, PNP, SILICONE, HIGH-POWER TYPE 2N7371 JANTX JANTXV, AND JANS (SUPERSEDING MIL-S-19500/623) (S/S BY MIL-PRF-19500/623B)

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】1997-11-20
【CCS分类】
【ICS分类】

MIL MIL-PRF-19500/228H

SEMICONDUCTOR DEVICE, DIODE, SILICONE, RECTIFIER, TYPES 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, JAN AND JANTX (SUPERSEDING MIL-S-19500/228G) (S/S BY MIL-PRF-19500/228J)
SEMICONDUCTOR DEVICE, DIODE, SILICONE, RECTIFIER, TYPES 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, JAN AND JANTX (SUPERSEDING MIL-S-19500/228G) (S/S BY MIL-PRF-19500/228J)

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】1997-09-14
【CCS分类】
【ICS分类】

MIL MIL-PRF-19500/228J

SEMICONDUCTOR DEVICE, DIODE, SILICONE, RECTIFIERE, TYPES 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, 1N3611EG1, 1N3612EG1, 1N3613EG1, 1N3614EG1, 1N3957EG1, JAN AND JANTX (SUPERSEDING MIL-PRF-19500/225H)(S/S BY MIL-PRF-19500/228K)
SEMICONDUCTOR DEVICE, DIODE, SILICONE, RECTIFIERE, TYPES 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, 1N3611EG1, 1N3612EG1, 1N3613EG1, 1N3614EG1, 1N3957EG1, JAN AND JANTX (SUPERSEDING MIL-PRF-19500/225H)(S/S BY MIL-PRF-19500/228K)

【发布单位或类别】 US-MIL美国军事规范和标准
【发布日期】2001-07-16
【CCS分类】
【ICS分类】

半导体环氧树脂检测标准

半导体材料痕量杂质分析用超纯树脂器皿

半导体行业超纯水工艺抛光混床用离子交换树脂产品认证技术要求

半导体行业超纯水工艺制程混床用离子交换树脂产品认证技术要求

半导体行业超纯水工艺预处理阴阳塔用离子交换树脂产品认证技术要求

北检院部分仪器展示