GB/T 17472-2022
Specification for pastes of precious metal used for microelectronics
GB/T 17473.5-2008
Test methods of pastes used for microelectronics - Determination of viscosity
GB/T 17473.2-2008
Test methods of presious metals pastes used for microelectronics - Determination of fineness
GB/T 17473.3-2008
Test methods of precious metals pastes used for microelectronics Determination of sheet resistance
GB/T 17473.1-2008
Test methods of precious metals pastes used for microelectronics-Determination of solids content
SJ/T 11512-2015
Test methods of electronic pastes for integrated circuit performent
GB/T 17473.4-2008
Test methods of precious metals pastes used for microelectronics - Determination of adhesion
GB/T 17473.6-2008
Test methods of precious metal pastes used for microelectronics - Determination of resolution
GB/T 17472-2008
Specification for pastes of precious metal used for microelectronics
GB/T 17473.7-2022
Test methods of precious metals pastes used for microelectronics—Part 7: Determination of solderability and solder leaching resistance
T/XYATB 008-2023
GB/T 17473.5-1998
Test methods of precious metal pastes used for thick film microelectronics—Determination of viscosity
GB/T 17473.7-2008
Test methods of precious metals pastes used for microelectronics—Determination of solderability and solderelaching resistance
GB/T 17473.1-1998
Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content
GB/T 17473.3-1998
Test methods of precious metal pastes used for thick film microelectronics—Determination of sheet resistance
GB/T 17473.2-1998
Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness
GB/T 17473.6-1998
Test methods of precious metal pastes used for thick-film microelectronics—Determination of resolution
GB/T 17473.4-1998
Test methods of precious metal pastes used for thick film microelectronics—Determination of adhesion
SJ 2659-1986
Resin-core solder tin wire for electronic industry
GB/T 17473.7-1998
Test methods of precious metal pastes used for thick film microelectronics—Test of solderability and solderleaching resistance