YS/T 1504-2021
GB/T 35996-2018(\u82f1\u6587\u7248)
磷矿石和磷精矿中八种元素含量的快速测定 X射线荧光光谱法
GB/T 13748.20-2009(\u82f1\u6587\u7248)
镁及镁合金化学分析方法 第20部分:ICP-AES测定元素含量
GB/T 13748.21-2009(\u82f1\u6587\u7248)
镁及镁合金化学分析方法 第21部分:光电直读原子发射光谱分析方法测定元素含量
DIN 19741
Soil quality - Determination of contents of the platinum group elements (platinum, palladium, rhodium) in soils, soil materials and sludges
DIN 19741-DRAFT
Draft Document - Soil quality - Determination of contents of the platinide group elements (platinum, palladium, rhodium) in soils and soil materials
GB/T 38161-2019
Palladium jewellery alloys—Determination of palladium—Inductively coupled plasma (ICP) spectrometric method using yttrium as internal standard element
GB/T 38145-2019
High content precious metals jewellery alloys—Determination of gold,platinum and palladium—Difference method using inductively coupled plasma optical emission spectroscopy
GB/T 38904-2020
Methods for elemental analysis of ceramic liquid pigments
GB/T 38423-2019
Determination of total concentration of certain elements in toys
GB/T 43719-2024
Jewellery and precious metals—Determination of palladium—Gravimetry using dimethylglyoxime
GB/T 39285-2020
Method for chemical analysis of palladium compounds—Determination of chlorine content—Ion chromatography
GB/T 23276-2024
Method for chemical analysis of palladium compounds—Determination of palladium content—Complexometric tityation using butanedione dioxime releasing EDTA and gravimetric method
GB/T 30647-2014
Determination of harmful elements total content of coatings
GB/T 23991-2009
Determination of soluble harmful elements content of coatings
QC/T 968-2014
Determination methods of platinum,palladium and rhodium contents in metallic catalytic converters
SN/T 3469.4-2014
GB/T 19720-2024
Jewellery and precious metals—Determination of platinum and palladium—Gravimetry using ammonium chloride and dimethylglyoxime
YS/T 1318.1-2019
Methods for chemical analysis of tetrammine palladium(Ⅱ)sulphate-Part 1:Determination of palladium content-Dimethylglyoxime gravimetry
GB/T 39145-2020
Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry